Accuracy analysis and error correction of MODIS surface reflectance products

Accuracy analysis and error correction of MODIS surface reflectance products

Author(s):

X. Liu ( Shanghai Univ. (China) and Yangtze Univ. (China) )

X. Li ( Shanghai Univ. (China) )

J. Mao ( Shanghai Univ. (China) )

Q. Zeng ( Shanghai Univ. (China) )

Q. Chen ( Shanghai Univ. of Engineering Science (China) )

C. Guan ( Shanghai Univ. (China) )

1 more

Publication title:

Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6752

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819469120 [0819469122]

Language:

English

Call no.:

P63600/6752

Type:

Conference Proceedings

Details

TDL ID:	ZA00046970
Series ID:	PA00000029
Conf. info. (Name):	Geoinformatics
Conf. info. (Number):	2007
Conf. info. (Venue):	Nanjing, China
Conf. info. (Date):	2007.05.25-2007.05.27

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