Blank Cover Image

Accuracy analysis and error correction of MODIS surface reflectance products

Author(s):
X. Liu ( Shanghai Univ. (China) and Yangtze Univ. (China) )
X. Li ( Shanghai Univ. (China) )
J. Mao ( Shanghai Univ. (China) )
Q. Zeng ( Shanghai Univ. (China) )
Q. Chen ( Shanghai Univ. of Engineering Science (China) )
C. Guan ( Shanghai Univ. (China) )
1 more
Publication title:
Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6752
Pub. date:
2007
Vol.:
6752
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819469120 [0819469122]
Language:
English
Call no.:
P63600/6752
Type:
Conference Proceedings

Similar Items:

J. Mao, T. He, X. Li, X. Liu, Q. Zeng

SPIE - The International Society of Optical Engineering

X. Zhou, Q. Zeng, J. Jiao

ESA Communications

Q. Zeng, J. Mao, X. Li, X. Liu

SPIE - The International Society of Optical Engineering

Mao, J., Liu, Y., Cheng, P., Li, X., Zeng, Q., Xia, J.

SPIE - The International Society of Optical Engineering

C. Ge, Z. Liu, J. Wu, Z. Li, Z. Huang

Society of Photo-optical Instrumentation Engineers

Guan, L., Huang, H.-L.A., Gao, W., Weisz, E., Li, J.

SPIE - The International Society of Optical Engineering

J. Li, B. Zhang, Q. Shen, X. Zhang, Z. Chen

Society of Photo-optical Instrumentation Engineers

Mao, J., Li, C., Lau, A.K.-H.

SPIE - The International Society of Optical Engineering

Li, C., Mao, J., Lau, K.-H.

SPIE-The International Society for Optical Engineering

Li, C., Lau, A.K.-H., Mao, J.

SPIE - The International Society of Optical Engineering

X. Zhou, Q. Zeng, J. Jiao

ESA Communications

Lau, K.-H., Li, C., Mao, J., Chen, J.-C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12