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Fault tolerant techniques for integrated circuits in submicron and nanotechnologies

Author(s):
A. Bacivarov ( EUROQUALROM, Univ. Politehnica Bucharest (Romania) )  
Publication title:
Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6635
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467799 [0819467790]
Language:
English
Call no.:
P63600/6635
Type:
Conference Proceedings

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