Blank Cover Image

Advanced applications of PXR at LEBRA, Nihon University

Author(s):
Y. Hayakawa ( Nihon Univ., Funabashi (Japan) )
K. Hayakawa ( Nihon Univ., Funabashi (Japan) )
M. Inagaki ( Nihon Univ., Funabashi (Japan) )
T. Kuwada ( Nihon Univ., Funabashi (Japan) )
A. Mori ( Nihon Univ., Funabashi (Japan) )
K. Nakao ( Nihon Univ., Funabashi (Japan) )
K. Nogami ( Nihon Univ., Funabashi (Japan) )
T. Sakae ( Nihon Univ., Matsudo (Japan) )
T. Sakai ( Nihon Univ., Funabashi (Japan) )
I. Sato ( Nihon Univ., Funabashi (Japan) )
Y. Takahashi ( Nihon Univ., Tokyo (Japan) )
T. Tanaka ( Nihon Univ., Funabashi (Japan) )
7 more
Publication title:
International conference on charged and neutral particles channeling phenomena II : 3-7 July 2006, Rome, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6634
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467782 [0819467782]
Language:
English
Call no.:
P63600/6634
Type:
Conference Proceedings

Similar Items:

E. Sato, R. Germer, H. Obara, E. Tanaka, H. Mori, T. Kawai, T. Inoue, A. Ogawa, M. Izumisawa, T. Ichimaru, K. Takahashi, …

SPIE - The International Society of Optical Engineering

Obara, H., Zuguchi, M., Sato, E., Tanaka, E., Mori, H., Usuki, T., Sato, K., Ojima, H., Takayama, K.

SPIE-The International Society for Optical Engineering

Hayakawa, T., Nogami, M.

SPIE-The International Society for Optical Engineering

Hayakawa,T., Ono,Y., Nogami,M.

SPIE - The International Society for Optical Engineering

Sato, E., Obata, F., Takahashi, K., Sato, S., Tanaka, E., Mori, H., Kawai, T., Ichimaru, T., Takayama, K., Ido, H.

SPIE - The International Society of Optical Engineering

Komatsu, M., Sato, E., Hayasi, Y., Usuki, T., Sato, K., Tanaka, E., Mori, H., Ojima, H., Takayama, K., Ido, H.

SPIE-The International Society for Optical Engineering

Sato, E., Tanaka, E., Mori, H., Kawai, T., Inoue, T., Ogawa, A., Izumisawa, M., Takahashi, K., Sato, S., Ichimaru, T., …

SPIE - The International Society of Optical Engineering

Ochiai, S., Sakai, Y., Sato, K., Ueda, T., Morishita, K., Okuda, H., Tanaka, M., Hojo, M., Waku, Y., Nakagawa, N., …

Trans Tech Publications

Sato, E., Tanaka, E., Mori, H., Kawai, T., Inoue, T., Ogawa, A., Izurnisawa, M., Takahashi, K., Sato, S., Ichimaru, T., …

SPIE - The International Society of Optical Engineering

Sato, E., Hayasi, Y., Tanaka, E., Mori, H., Kawai, T., Ichimaru, T., Obata, F., Takahashi, K., Sato, S., Takayama, K., …

SPIE - The International Society of Optical Engineering

Sato, E., Tanaka, E., Mori, H., Kawai, T., Inoue, T., Ogawa, A., Izumisawa, M., Takahashi, K., Sato, S., Ichimaru, T., …

SPIE - The International Society of Optical Engineering

Nakajima,Y., Sato,E., Tanioka,K., Kawai,T., Tanaka,E., Kobayashi,W., Yamamoto,Y., Fujii,M., Shinozaki,Y., Kan,Y., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12