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Nanoscale linear measurements based on the attenuated total internal reflection: an interferometric approach

Author(s):
H. Stoyanov ( Univ. of Sofia (Bulgaria) )  
Publication title:
14th international school on quantum electronics : laser physics and applications : 18-22 September 2006, Sunny Beach, Bulgaria
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6604
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467423 [0819467421]
Language:
English
Call no.:
P63600/6604
Type:
Conference Proceedings

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