Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs
- Author(s):
- C.-H. Chen ( McMaster Univ. (Canada) )
- Z. Zeng ( United Microelectronics Corp. Group (USA) )
- J.-S. Jan ( United Microelectronics Corp. Group (USA) )
- K.-C. Wang ( United Microelectronics Corp. Group (USA) )
- C.-s Yeh ( United Microelectronics Corp. (Taiwan) )
- Publication title:
- Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6600
- Pub. Year:
- 2007
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819467379 [0819467375]
- Language:
- English
- Call no.:
- P63600/6600
- Type:
- Conference Proceedings
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