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Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs

Author(s):
  • C.-H. Chen ( McMaster Univ. (Canada) )
  • Z. Zeng ( United Microelectronics Corp. Group (USA) )
  • J.-S. Jan ( United Microelectronics Corp. Group (USA) )
  • K.-C. Wang ( United Microelectronics Corp. Group (USA) )
  • C.-s Yeh ( United Microelectronics Corp. (Taiwan) )
Publication title:
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6600
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467379 [0819467375]
Language:
English
Call no.:
P63600/6600
Type:
Conference Proceedings

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