Light-induced damage and its diagnosis in two-photon excited autofluorescence imaging of retinal pigment epithelium cells

Light-induced damage and its diagnosis in two-photon excited autofluorescence imaging of retinal pigment epithelium cells

Author(s):

D. Chen ( Shenzhen Univ. (China) )
J. Qu ( Shenzhen Univ. (China) )
G. Xu ( Shenzhen Univ. (China) )
L. Zhao ( Shenzhen Univ. (China) )
H. Niu ( Shenzhen Univ. (China) )

Publication title:

Fifth International Conference on Photonics and Imaging in Biology and Medicine

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6534

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466563 [0819466565]

Language:

English

Call no.:

P63600/6534

Type:

Conference Proceedings

Details

TDL ID:	ZA00046841
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Photonics and Imaging in Biology and Medicine
Conf. info. (Number):	2006 : 5th
Conf. info. (Venue):	Wuhan, China
Conf. info. (Date):	2006.09.01-2006.09.03

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