Multimode dynamics of atomic-force-microscope tip-sample interactions and application of sensitivity vector fields
- Author(s):
- J. Lim ( Univ. of Michigan (USA) )
- B. I. Epureanu ( Univ. of Michigan (USA) )
- Publication title:
- Sensors and smart structures, technologies for civil, mechanical, and aerospace systems
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6529
- Pub. Year:
- 2007
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466501 [0819466506]
- Language:
- English
- Call no.:
- P63600/6529
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Application of carbon nanotube probes in a critical dimension atomic force microscope
SPIE - The International Society of Optical Engineering |
National Aeronautics and Space Adminstration |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Precision carbon nanotube tip for critical dimension measurement with atomic force microscope
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Nanomechanical Interactions of Scanning Force Microscope Tips with Polymer Surfaces
Kluwer Academic Publishers |
Society of Photo-optical Instrumentation Engineers |
5
Conference Proceedings
"Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"
Kluwer Academic Publishers |
11
Conference Proceedings
Sensitivity of atomic force microscope vibration modes to changes in surface stiffness
SPIE-The International Society for Optical Engineering |
Materials Research Society |
12
Conference Proceedings
Measurement of pitch and width samples with the NIST calibrated atomic force microscope
SPIE-The International Society for Optical Engineering |