Reference-based damage diagnosis of structure using embedded statistical model

Reference-based damage diagnosis of structure using embedded statistical model

Author(s):

C. Loh ( National Taiwan Univ. (Taiwan) )
A. Wu ( National Taiwan Univ. (Taiwan) )
S. Huang ( National Taiwan Univ. (Taiwan) )
S. Chao ( National Taiwan Univ. (Taiwan) )

Publication title:

Sensors and smart structures, technologies for civil, mechanical, and aerospace systems

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6529

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466501 [0819466506]

Language:

English

Call no.:

P63600/6529

Type:

Conference Proceedings

Details

TDL ID:	ZA00046836
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures : Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
Conf. info. (Number):	2007
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2007.03.19-2007.03.22

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