Evaluating the performance of a 193-nm hyper-NA immersion scanner using scatterometry

Evaluating the performance of a 193-nm hyper-NA immersion scanner using scatterometry

Author(s):

O. Kritsun ( Advanced Micro Devices, Inc. (USA) )

B. L. Fontaine ( Advanced Micro Devices, Inc. (USA) )

R. Sandberg ( Advanced Micro Devices, Inc. (USA) )

A. Acheta ( Advanced Micro Devices, Inc. (USA) )

H. J. Levinson ( Advanced Micro Devices, Inc. (USA) )

K. Lensing ( Advanced Micro Devices, Inc. (USA) )

M. Dusa ( ASML MaskTools Inc. (USA) )

J. Hauschild ( ASML MaskTools Inc. (USA) )

A. Pici ( ASML MaskTools Inc. (USA) )

C. Saravanan ( Nanometrics Inc. (USA) )

K. Primak ( Nanometrics Inc. (USA) )

R. Korlahalli ( Nanometrics Inc. (USA) )

S. Nirmalgandhi ( Nanometrics Inc. (USA) )

8 more

Publication title:

Optical microlithography XX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6520

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466396 [0819466395]

Language:

English

Call no.:

P63600/6520

Type:

Conference Proceedings

Details

TDL ID:	ZA00046827
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Optical Microlithography
Conf. info. (Number):	2007 : 20th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2007.02.27-2007.03.02

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