Basic scanner for parallepipedic manufactured pieces

Basic scanner for parallepipedic manufactured pieces

Author(s):

H. Hrimech ( Le2i, UMR CNRS 5158, Univ. de Bourgogne (France) )
J. Paveglio ( Le2i, UMR CNRS 5158, Univ. de Bourgogne (France) )
F. Marzani ( Le2i, UMR CNRS 5158, Univ. de Bourgogne (France) )
Y. Voisin ( Le2i, UMR CNRS 5158, Univ. de Bourgogne (France) )

Publication title:

Machine vision applications in industrial inspection XV : 29-30 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6503

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466167 [0819466166]

Language:

English

Call no.:

P63600/6503

Type:

Conference Proceedings

Details

TDL ID:	ZA00046810
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Machine Vision Applications in Industrial Inspection
Conf. info. (Number):	2007 : 15th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2007.01.29-2007.01.30

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