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A temperature-resistant wide-dynamic-range CMOS image sensor

Author(s):
K. Mizobuchi ( Texas Instruments Japan (Japan) )
S. Adachi ( Texas Instruments Japan (Japan) )
T. Yamashita ( Texas Instruments Japan (Japan) )
S. Okamura ( Texas Instruments Japan (Japan) )
H. Oshikubo ( Texas Instruments Japan (Japan) )
N. Akahane ( Tohoku Univ. (Japan) )
S. Sugawa ( Tohoku Univ. (Japan) )
2 more
Publication title:
Sensors, cameras, and systems for scientific/industrial applications VIII : 30 January-1 February 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6501
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466143 [081946614X]
Language:
English
Call no.:
P63600/6501
Type:
Conference Proceedings

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