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Image quality difference modelling of a mobile display

Author(s):
J. J. Yoo ( Univ. of Leeds (United Kingdom) )
Y. Kim ( Univ. of Leeds (United Kingdom) )
M. R. Luo ( Univ. of Leeds (United Kingdom) )
W. Choi ( Samsung Advanced Institute of Technology (South Korea) )
S. Lee ( Samsung Advanced Institute of Technology (South Korea) )
D. S. Park ( Samsung Advanced Institute of Technology (South Korea) )
C. Y. Kim ( Samsung Advanced Institute of Technology (South Korea) )
2 more
Publication title:
Image quality and system performance IV : 30 January-1 February 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6494
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466075 [0819466077]
Language:
English
Call no.:
P63600/6494
Type:
Conference Proceedings

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