Gamut mapping method for ICC saturated intent

Author(s):

• M. Cho ( Samsung Advanced Institute of Technology (South Korea) )
• H. Choh ( Samsung Advanced Institute of Technology (South Korea) )
• S. Kim ( Samsung Advanced Institute of Technology (South Korea) )
• Y. Kim ( Samsung Advanced Institute of Technology (South Korea) )
• Y. Bang ( Samsung Advanced Institute of Technology (South Korea) )

Publication title:

Color imaging XII : processing, hardcopy, and applications : 30 January-1 February 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6493

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466068 [0819466069]

Language:

English

Call no.:

P63600/6493

Type:

Conference Proceedings