Optical properties of n- and p-type ZnO thin films: two different approaches to the impurity distribution inhomogeneity

Optical properties of n- and p-type ZnO thin films: two different approaches to the impurity distribution inhomogeneity

Author(s):: T. Makino ( Univ. of Hyogo (Japan) )
Publication title:: Ultrafast phenomena in semiconductors and nanostructure materials XI and semiconductor photodetectors IV : 22-24 January 2007, San Jose, California, USA
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 6471
Pub. Year:: 2007
Pub. info.:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819465849 [0819465844]
Language:: English
Call no.:: P63600/6471
Type:: Conference Proceedings

Details

TDL ID:	ZA00046779
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Ultrafast Phenomena in Semiconductors and Nanostructure Materials ; Semiconductor Photodetectors
Conf. info. (Number):	2007 : 11th ; 4th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2007.01.22-2007.01.24

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