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Recent trends in white-light interferometry

Author(s):
K. Kitagawa ( Toray Engineering Co., Ltd. (Japan) )  
Publication title:
Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6382
Pub. Year:
2006
Paper no.:
638201
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464804 [0819464805]
Language:
English
Call no.:
P63600/6382
Type:
Conference Proceedings

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