The development of radon chamber based on dynamic replenishment model

Author(s):

• S. Zhou ( East China Institute of Technology (China) )
• Y. Sun ( Nanjing Univ. of Science and Technology (China) )
• L. Lu ( East China Institute of Technology (China) )
• Y. Gao ( East China Institute of Technology (China) )

Publication title:

Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6357

Pub. Year:

2006

Pt.:

1

Paper no.:

635727

Page(from):

635727-1

Page(to):

635727-6

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464521 [081946452X]

Language:

English

Call no.:

P63600/6357

Type:

Conference Proceedings