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Wavelength selection to increase robustness of the multivariate calibration model in near infrared spectroscopy

Author(s):
  • Q. Li ( BeiHang Univ. (China) )
  • X. Li ( BeiHang Univ. (China) )
  • G. Zhang ( BeiHang Univ. (China) )
  • K. Xu ( Tianjin Univ. (China) )
  • Y. Wang ( Tianjin Univ. (China) )
Publication title:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6357
Pub. Year:
2006
Pt.:
1
Paper no.:
63570T
Page(from):
63570T-1
Page(to):
63570T-7
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464521 [081946452X]
Language:
English
Call no.:
P63600/6357
Type:
Conference Proceedings

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