Blank Cover Image

Detection and removal of inveracious edges of shadows based on wavelet transform

Author(s):
  • C. Li ( BeiHang Univ. (China) and Jiaozuo Univ. (China) )
  • H. Yao ( General Administration of Civil Aviation of China (China) )
  • Q. Ma ( BeiHang Univ. (China) )
Publication title:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6357
Pub. Year:
2006
Pt.:
1
Paper no.:
63570K
Page(from):
63570K-1
Page(to):
63570K-5
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464521 [081946452X]
Language:
English
Call no.:
P63600/6357
Type:
Conference Proceedings

Similar Items:

P. Ding, Q. S. Ma, C. Y. Li, H. Y. Yao

SPIE - The International Society of Optical Engineering

Yang, J., Zhao, Z., Ma, J., Wang, C.

SPIE - The International Society of Optical Engineering

Li, H.G., Wang, J.

SPIE-The International Society for Optical Engineering

K. Li, Q. Dai, W. Xu

Society of Photo-optical Instrumentation Engineers

Yi S., Cao H., Li X., Liu M.

SPIE - The International Society of Optical Engineering

Fang,J., Xiong,C.Y., Li,H.J., Li,M., Zhang,J.

SPIE-The International Society for Optical Engineering

Y. Huang, H. Duan

Society of Photo-optical Instrumentation Engineers

Guler E. C., Sankur B., Anarim E., Mendi C. D., Alkin O., Kahya Y. P., Engin T.

Kluwer Academic Publishers

Li, Y., Ni, H., Pang, W., Hao, Z.

SPIE - The International Society of Optical Engineering

Han Q., Zhu M., Yao Z.

SPIE - The International Society of Optical Engineering

Johnson,A.,III, Li,C.-C.

SPIE-The International Society for Optical Engineering

Ma, Cui Hong, Li, Yi, Wang, Ying

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12