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High-speed phase shifting profilometry with dual-frequency digital projection grating pattern

Author(s):
  • Y. Chen ( Huazhong Univ. of Science and Technology (China) )
  • Y. He ( Huazhong Univ. of Science and Technology (China) )
  • E. Hu ( Huazhong Univ. of Science and Technology (China) )
  • H. Zhu ( Huazhong Univ. of Science and Technology (China) )
Publication title:
27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6279
Pub. Year:
2007
Pt.:
2
Paper no.:
62794Y
Page(from):
62794Y-1
Page(to):
62794Y-7
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463494 [0819463493]
Language:
English
Call no.:
P63600/6279
Type:
Conference Proceedings

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