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Evidence of Reduced Self Heating With Partially Depleted SOI MOSFET Scaling

Author(s):
Georges Guegan
Romain Gwoziecki
Olivier Gonnard
Gilles Gouget
Christine Raynaud
Mikael Casse
Simon Deleonibus
2 more
Publication title:
Transistor scaling--methods, materials and modeling : symposium held April 18-19, 2006, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
913
Pub. date:
2006
Vol.:
913
Page(from):
79
Page(to):
84
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998698 [1558998691]
Language:
English
Call no.:
M23500/913
Type:
Conference Proceedings

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