Blank Cover Image

Evaluation of Specific Contact Resistance of Al, Ti, and Ni Contacts to N Ion Implanted 3C-SiC(100)

Author(s):
Publication title:
Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006
Title of ser.:
Materials science forum
Ser. no.:
556-557
Pub. Year:
2007
Page(from):
705
Page(to):
708
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494422 [0878494421]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

E. Taguchi, Y. Suzuki, M. Satoh

Trans Tech Publications

Satoh, M.

Trans Tech Publications

Satoh, M., Matsuo, H.

Trans Tech Publications

Satoh, M.

Trans Tech Publications

Shibagaki, M., Satoh, M, Kurematsu, Y., Numajiri, K., Watanabe, F., Haga, S., Miura, K., Suzuki, T., Miyagawa, S.

Trans Tech Publications

Satoh, M., Suzuki, T., Miyagawa, S.

Trans Tech Publications

M. Satoh, S. Nagata, T. Nakamura, H. Doi, M. Shibagaki

Trans Tech Publications

Anne-Elisabeth Bazin, Jean-François Michaud, Marc Portail, Thierry Chassagne, Marcin Zielinski, Jean-Marc Lecoq, …

Materials Research Society

A.E. Bazin, T. Chassagne, J.F. Michaud, A. Leycuras, M. Portail, M. Zielinski, E. Collard, D. Alquier

Trans Tech Publications

Shibagaki, M., Kurematsu, Y., Watanabe, F., Haga, S., Miura, K., Suzuki, T., Satoh, M.

Trans Tech Publications

M. de Silva, T. Sato, S.I. Kuroki, T. Kikkawa

Trans Tech Publications

Egorov,S.A., Evard,M.E.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12