Blank Cover Image

Comparative Investigation between X-Ray Diffraction and Cross Polarization Mapping of 4H-SiC Wafers Off-Cut 4° Towards (11-20)

Author(s):
D.K. Gaskill
M.A. Mastro
K.K. Lew
B.L. Van Mil
R.L. Myers-Ward
R.T. Holm
C.R. Eddy Jr
2 more
Publication title:
Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006
Title of ser.:
Materials science forum
Ser. no.:
556-557
Pub. Year:
2007
Page(from):
235
Page(to):
238
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494422 [0878494421]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

K.K. Lew, B.L. Van Mil, R.L. Myers-Ward, R.T. Holm, C.R. Eddy Jr., D.K. Gaskill

Trans Tech Publications

B.L. Vanmil, R.E. Stahlbush, R.L. Myers-Ward, Y.N. Picard, S.A. Kitt

Trans Tech Publications

B.L. Van Mil, K.K. Lew, R.L. Myers-Ward, R.T. Holm, D.K. Gaskill, C.R. Eddy Jr

Trans Tech Publications

R.E. Stahlbush, R.L. Myers-Ward, B.L. VanMil, D.K. Gaskill, C.R. Eddy Jr.

Trans Tech Publications

R.E. Stahlbush, B.L. VanMil, K.X. Liu, K.K. Lew, R.L. Myers-Ward

Trans Tech Publications

V.K. Nagareddy, D.K. Gaskill, J.L. Tedesco, R.L. Myers-Ward, C.R. Eddy

Trans Tech Publications

R.L. Myers-Ward, K.K. Lew, B.L. VanMil, R.E. Stahlbush, K.X. Liu

Trans Tech Publications

R.L. Myers-Ward, B.L. VanMil, R.E. Stahlbush, S.L. Katz, J.M. McCrate

Trans Tech Publications

P.B. Klein, R.L. Myers-Ward, K.K. Lew, B.L. VanMil, C.R. Eddy Jr.

Trans Tech Publications

11 Conference Proceedings Microhardness of 6H- and 4H-SiC Substrates

C.R. Eddy Jr., P. Wu, I. Zwieback, B.L. VanMil, R.L. Myers-Ward

Trans Tech Publications

V.D. Wheeler, B.L. VanMil, R.L. Myers-Ward, S. Chung, Y.N. Picard

Trans Tech Publications

D.K. Gaskill, J. Hu, X. Xin, J.H. Zhao, B.L. VanMil

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12