Blank Cover Image

Effect of Processing Factors on Critical Current Density in Bi2212/Ag Wires

Author(s):
S.C. Kim
D.W. Ha
S.S. Oh
I.Y. Han
H.S. Ha
H.S. Sohn
1 more
Publication title:
Progress in powder metallurgy : proceedings of the 2006 Powder Metallurgy World Congress & Exhibition (PM 2006), held in Busan Exhibition & Convention Center (BEXCO), Busan, Korea, September 24-28, 2006
Title of ser.:
Materials science forum
Ser. no.:
534-536
Pub. Year:
2007
Pt.:
2
Page(from):
1593
Page(to):
1596
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494194 [0878494197]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The Effect of Deformation Stress-Strain and Temperature on The Ic Degradation of Bi-2223/Ag Tapes

H.S. Ha, S.C. Kim, D.W. Ha, S.S. Oh, J.H. Joo

Trans Tech Publications
7 Conference Proceedings Inspection of the TFT Devices Using the Low-Energy Electron Beam Emitted from the Microcolumn

T.S. Oh, S.J. Ahn, D.W. Kim, H.S. Kim

Trans Tech Publications
2 Conference Proceedings Influence of Applied Tensile and Bending Strains on Local and Overall Critical Current of Multifilamentary Bi2223-Composite Superconductor

S. Ochiai, D. Doko, H. Okuda, S.S. Oh, D.W. Ha, M. Tanaka, M. Hojo, K. Osamura, M. Miura

Trans Tech Publications
8 Conference Proceedings Fast Inspection of Non-Visual Defects in the Wafer Surface Using Two Low-Energy E-Beam Sources

S.J. Ahn, T.S. Oh, D.W. Kim, H.S. Kim

Trans Tech Publications
3 Conference Proceedings CRITICAL CURRENT DENSITIES Jc(H,T) AND CURRENT-VOLTAGE CHARACTERISTICS IN MELT PROCESSED Bi-2212 WITH AND WITHOUT PREFERENTIAL ORIENTATION

Paul, W., Heeb, B., Baumann, Th., Guidolin, M., Gauckler, L.J.

Materials Research Society
9 Conference Proceedings Magnetic resonance current density image reconstruction in the spatial frequency domain

Lee, S.Y., Lee, S.C., Oh, S.H., Han, J.Y., Han, B.H., Cho, M.H.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings A Simple optical system parameter optimization method by comparing the critical dimension

Ha, M.-A., Sohn, D.-S., Jun, K.-A., Yoo, J.-Y., Oh, H.-K., Kim, J., Park, I.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Resolution improvement of chemical-amplification resist using process-induced effect correction

Choi,J.-H., Kim,C.-Y., Lee,J.-Y., Moon,S.-W., Choi,S.-W., Han,W.-S., Sohn,J.-M.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Fabrication of Bi-2212/SrSO4 Composite Superconductors by Melting Powder Mixtures

K.T. Kim, S.H. Jang, J.H. Lim, E.C. Park, J.H. Joo, H.J. Lee, G.W. Hong, C.J. Kim, H.R. Kim, O.B. Hyun

Trans Tech Publications
11 Conference Proceedings Preparation of Multi-Core Bi-2212/Ag Wires

Q.B. Hao, C.S. Li, S.N. Zhang, G.S. Li, L.F. Bai

Trans Tech Publications
6 Conference Proceedings Fluorescence Characteristics of Near Ultraviolet Laser Dyes and its Laser Output Pumped by HCP,

Oh,C.H., Han,M.H., Choi,D.W., Park,S.J., Suk,S.S.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings MAGNETIC PENETRATION DEPTH AND INTRAGRAIN CRITICAL CURRENT DENSITY IN GRAIN-ALIGNED T12Ca2Ba2Cu3O10 SUPERCONDUCTOR

Thompson, J.R., Christen, D.K., Deeds, H.A., Kim, Y.C., Brynestad, J., Sekula, S.T., Budai, J., Ossandon, J.G.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12