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Roughness measurements on coupling structures for optical interconnections integrated on a printed circuit board [6185-51]

Author(s):
Hendrickx N. ( Ghent Univ. (Belgium) )
Van Erps J. ( Vrije Univ. Brussel (Belgium) )
Suyal H.
Taghizadeh M. ( Heriot-Watt Univ. (United Kingdom) )
Thienpont H. ( Vrije Univ. Brussel (Belgium) )
Van Daele P. ( Ghent Univ. (Belgium) )
1 more
Publication title:
Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6185
Pub. Year:
2006
Page(from):
61851E
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462411 [0819462411]
Language:
English
Call no.:
P63600/6185
Type:
Conference Proceedings

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