Blank Cover Image

Extraction of linear features on SAR imagery [6419-35]

Author(s):
  • Liu, J.
  • Li, D. ( Wuhan Univ. (China) )
  • Mei, X. ( Institute of Remote Sensing Applications (China) )
Publication title:
Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6419
Pub. Year:
2006
Page(from):
64190Z
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819465283 [0819465283]
Language:
English
Call no.:
P63600/6419
Type:
Conference Proceedings

Similar Items:

Mei, X., Niu, R., Zhang, L., Li, P.

SPIE - The International Society of Optical Engineering

Mo, D., Lin, H., Sun, H., Li, J., Xiong, Y., Liu, T.

SPIE - The International Society of Optical Engineering

J. Liu, D. Li, H. Sui, X. Mei

Society of Photo-optical Instrumentation Engineers

Liu,Z.-S., Li,J.

SPIE-The International Society for Optical Engineering

Liu, J., Li, D., Yang, J.

SPIE - The International Society of Optical Engineering

M. Tello, C. Lopez-Martinez, J. J. Mallorqui

ESA Communication Production Office

Chen, P., Huang, W., Yang, J., Fu, B.

SPIE - The International Society of Optical Engineering

Liu,Z.-S., Li,J.

SPIE-The International Society for Optical Engineering

Mao, J., Liu, Y., Cheng, P., Li, X., Zeng, Q., Xia, J.

SPIE - The International Society of Optical Engineering

Liu, X., Li, Q.

SPIE - The International Society of Optical Engineering

Guan, L., Wang, P., Liu, X.

SPIE - The International Society of Optical Engineering

Soares,J.V., Renno,C.D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12