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A methodology for measurements of basic parameters in a xDSL system [6390-24]

Author(s):
Brito Jr., E.
de Souza, L. V.
Patrico, E. T.
Castro, A. L. S.
dos S. Cavalcante, G. P.
Costa, J. C. W. A. ( Federal Univ. of Para (Brazil) )
Ericson, K.
Lindqvist, F.
Rius I Riu, J. ( Ericsson AB (Sweden) )
4 more
Publication title:
Broadband access communication technologies : 2-3 October, 2006, Boston, Massachusetts, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6390
Pub. Year:
2006
Page(from):
63900M
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464880 [0819464880]
Language:
English
Call no.:
P63600/6390
Type:
Conference Proceedings

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