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The effect of processes on the reliability of GaN-based light emitting diodes [6355-21]

Author(s):
Xiao, Z. ( Dalian Luming Science and Technology Group Co., Ltd. (China) )
He, X.
Ma, K.
Chen, X.
Wu, S.
Ke, Z. ( Dalian Lumei Optoelectronics Corp. (China) )
1 more
Publication title:
Advanced LEDs for solid state lighting : 5-7 September 2006, Gwangju, South Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6355
Pub. Year:
2006
Page(from):
63550K
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464507 [0819464503]
Language:
English
Call no.:
P63600/6355
Type:
Conference Proceedings

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