A novel fault detection method based on probe cycle cover in mesh optical burst switching networks [6354-34]

A novel fault detection method based on probe cycle cover in mesh optical burst switching networks [6354-34]

Author(s):

Chang, J. ( Chongqing Univ. of Posts and Telecommunciations (China) )
Wang, R.
Long, K. ( Chongqing Univ. of Posts and Telecommunciations (China) and Univ. of Electronic Science and Technology (China) )
Yang, X. ( Chongqing Univ. of Posts and Telecommunciations (China) )

Publication title:

Network Architectures, Management, and Applications IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6354

Pub. Year:

2006

Pt.:

1

Page(from):

63540W

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464491 [081946449X]

Language:

English

Call no.:

P63600/6354

Type:

Conference Proceedings

Details

TDL ID:	ZA00016358
Series ID:	PA00000029
Conf. info. (Name):	Asia Communications and Photonics
Conf. info. (Number):	2006
Conf. info. (Venue):	Gwangju, South Korea
Conf. info. (Date):	2006.09.05-2006.09.07

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