Blank Cover Image

Holographic nanolithography techniques for the fabrication of microcavity arrays [6352-146]

Author(s):
  • Kim, J. H. ( Pohang Univ. of Science and Technology (South Korea) )
  • Kim, C. ( LG-Phillips LCD) (South Korea) )
  • Han, H. ( Pohang Univ. of Science and Technology (South Korea) )
Publication title:
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6352
Pub. Year:
2006
Pt.:
2
Page(from):
63523T
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464477 [0819464473]
Language:
English
Call no.:
P63600/6352
Type:
Conference Proceedings

Similar Items:

Kim, Y., Gao, Q., Joyce, H. J., Tan, H. H., Jagadish, C., Paladugu, M., Zhou, J.

SPIE - The International Society of Optical Engineering

Kim,C.-H., Jeon,C.-U., Han,S.-J., Cho,W.-I., Choi,S.-W., Han,W.-S., Sohn,J.-M.

SPIE-The International Society for Optical Engineering

Park, H., Kim, J., Jung, E., Choi, W., Lee, K., Han, H.

SPIE - The International Society of Optical Engineering

Ji,C.-H, Kim,Y.-K.

SPIE-The International Society for Optical Engineering

Choi, Y., Lee, K.-H., Kim, J.-H.

SPIE - The International Society of Optical Engineering

Ho H. P, Wong C. L, Lei K. F, Li W. J, Lin C., Kong S.K

SPIE - The International Society of Optical Engineering

Shin, C. W., Kim, N., Kim, J. H., Vu, V. T., Suh, D. W., Paek, M. C., Park, Y. W.

SPIE - The International Society of Optical Engineering

10 Conference Proceedings Holographic interferometry technique

Ismailov,D.A., Jeenbeav,J.J., Joumaliev,K.M., Yu,H.C.

SPIE-The International Society for Optical Engineering

Yoon,J.-B., Han,C.-H., Yoon,E., Kim,C.-K.

SPIE-The International Society for Optical Engineering

Kim,C.-J.

SPIE-The International Society for Optical Engineering

Sung, G. Y., Kim, K.-H., Huh, C., Shin, J. H.

SPIE - The International Society of Optical Engineering

G. Cheng, T. Xing, W. Lin, J. Zhou, C. Qiu, Z. Liao, Y. Yang, L. Hong, J. Ma

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12