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The testing of responding time delay of the hybrid integrated circuit of PIN photodiode [6352-70]

Author(s):
Publication title:
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6352
Pub. Year:
2006
Pt.:
2
Page(from):
63521R
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464477 [0819464473]
Language:
English
Call no.:
P63600/6352
Type:
Conference Proceedings

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