Focused-ion-beam post-processing technology for active devices [6352-39]

Focused-ion-beam post-processing technology for active devices [6352-39]

Author(s):

Tee, C. W.
Lau, F. K.
Zhao, X.
Penty, R.
White, I. ( Univ. of Cambridge (United Kingdom) )

Publication title:

Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6352

Pub. Year:

2006

Pt.:

1

Page(from):

635210

Page(to):

635211

Pages:

2

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464477 [0819464473]

Language:

English

Call no.:

P63600/6352

Type:

Conference Proceedings

Details

TDL ID:	ZA00016356
Series ID:	PA00000029
Conf. info. (Name):	Asia Communications and Photonics
Conf. info. (Number):	2006
Conf. info. (Venue):	Gwangju, South Korea
Conf. info. (Date):	2006.09.05-2006.09.07

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