Revisiting mask contact hole measurements [6349-158]

Revisiting mask contact hole measurements [6349-158]

Author(s):

Higuchi, M. ( Toppan Electronics Inc. (USA) )

Gallagher, E. ( IBM Microelectronics (USA) )

Ceperley, D. ( Univ. of California, Berkeley (USA) )

Brunner, T.

Bowley, R.

McGuire, A. ( IBM Microelectronics (USA) )

1 more

Publication title:

Photomask Technology 2006

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6349

Pub. Year:

2006

Pt.:

2

Page(from):

634947

Page(to):

634948

Pages:

2

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464446 [0819464449]

Language:

English

Call no.:

P63600/6349

Type:

Conference Proceedings

Details

TDL ID:	ZA00016353
Series ID:	PA00000029
Conf. info. (Name):	SPIE Photomask Technology : Annual BACUS Symposium on Photomask Technology
Conf. info. (Number):	2006 : 26th
Conf. info. (Venue):	Monterey, CA, USA
Conf. info. (Date):	2006.09.19-2006.09.22

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