Blank Cover Image

In-plane vibration measurement of microdevices by the knife-edge technique in reflection mode [6345-49]

Author(s):
Bosseboeuf, A.
Breluzeau, C.
Parrain, F.
Coste, P.
Gilles, J.-P.
Megherbi, S.
Le Roux, X. ( Institut d’Electronique Fondamentale, CNRS, Univ. Paris Sud Xl (France) )
2 more
Publication title:
Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications : 19-22 June 2006, Ancona, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6345
Pub. Year:
2006
Page(from):
63451D
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464217 [081946421X]
Language:
English
Call no.:
P63600/6345
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators

H. V. Le, M. Gouiffes, F. Parrain, A. Bosseboeuf, B. Zavidovique

Society of Photo-optical Instrumentation Engineers
7 Conference Proceedings Measurement of optical surfaces with knife edge method

H. Jing, B. Fan, S. Wu, F. Wu, T. Fan

Society of Photo-optical Instrumentation Engineers
2 Conference Proceedings Assessment of technology and (thermo)mechanical behaviour of MEMS devices by interference microscopy (Invited Paper) [5856-64]

Bosseboeuf, A., Breluzeau, C., Petitgrand, S.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Adaptive fiber optic interferometer with CdTe crystal for vibrations measurement [6345-42]

Romashko, R. V., Di Giloramo, S., Nippolainen, E., Launay, J. C., Kamshilin, A. A.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Versatile microscopic profilometer-vibrometer for static and dynamic characterization of micromechanical devices

Bosseboeuf, A., Gilles, J. P., Danaie, K., Yahiaoui, R., Dupeux, M., Puissant, J. P., Chabrier, A., Fort, F., Coste, P.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Recent progress in accurate vibration measurements by laser techniques [6345-01]

von Martens, H.-J., Bruns, T., Taubner, A., Wabinski, W., Gobel, U.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Study of subpixel image processing algorithms for MEMS in-plane vibration measurements by stroboscopic microscopy

Hafiane, A., Petitgrand, S., Gigan, O., Bouchafa, S., Bosseboeuf, A.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Vibration measurement and mode analysis on concrete structures with embedded fiber Bragg grating sensors

Wang,Y., Tjin,S.C., Moyo,P., Zheng,X., Brownjohn,J.M.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Multilayer Au-Si Eutectic Wafer Bonding with Microstructured Sealing Rings

S. Lani, A. Bosseboeuf, O. Garel, F. Parrain, N. Isac

Electrochemical Society
11 Conference Proceedings Quantitative time-averaged microscopic interferometry for micromechanical device vibration mode characterization

Petitgrand,S., Yahiaoui,R., Bosseboeuf,A., Danaie,K.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Automated fringe-pattern extrapolation for patterned surface profiling by interference microscopy with Fourier transform analysis [5858-11]

Breluzeau, C., Bosseboeuf, A., Petitgrand, S., Fogale Nanotech (France), Leroux, X., Institut d’Electronique …

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Non-Destructive Monitoring of the Thermal Aging of Cast Duplex Stainless Steels Using Thermopower Measurements

J.-F. Coste, Y. Kawaguchi

American Society of Mechanical Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12