Cd0.55Mn0.45Te crystal growth, microstructure, and electrical resistivity [6319A-34]

Cd0.55Mn0.45Te crystal growth, microstructure, and electrical resistivity [6319A-34]

Author(s):

Black, M. A.
Orlova, T.
Lu, F. Y.
Li, L. ( Yinnel Tech, Inc. (USA) )

Publication title:

Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6319

Pub. Year:

2006

Page(from):

631913

Page(to):

631913

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463982 [0819463981]

Language:

English

Call no.:

P63600/6319

Type:

Conference Proceedings

Details

TDL ID:	ZA00016325
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Hard X-ray and gamma-ray detector physics and Penetrating radiation systems
Conf. info. (Number):	2006 : 8th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.14-2006.08.17

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