
Laboratory-based x-ray micro-tomography with submicron resolution (Invited Paper) [6318-51]
- Author(s):
- Mayo, S.
- Miller, P.
- Wilkins, S. W.
- Gao, D.
- Gureyev, T. ( CSIRO Manufacturing and Infrastructure Technology (Australia) )
- Publication title:
- Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6318
- Pub. date:
- 2006
- Page(from):
- 63181E
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819463975 [0819463973]
- Language:
- English
- Call no.:
- P63600/6318
- Type:
- Conference Proceedings
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