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Laboratory-based x-ray micro-tomography with submicron resolution (Invited Paper) [6318-51]

Author(s):
Publication title:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6318
Pub. date:
2006
Page(from):
63181E
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
Language:
English
Call no.:
P63600/6318
Type:
Conference Proceedings

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