Blank Cover Image

Laboratory-based x-ray micro-tomography with submicron resolution (Invited Paper) [6318-51]

Author(s):
Publication title:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6318
Pub. date:
2006
Page(from):
63181E
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
Language:
English
Call no.:
P63600/6318
Type:
Conference Proceedings

Similar Items:

Gureyev, T. E., Myers, G. R., Nesterets, Y. I., Paganin, D. M., Pavlov, K. M., Wilkins, S. W.

SPIE - The International Society of Optical Engineering

Tkachuk, A., Feser, M., Cui, H., Duewer, F., Chang, H., Yun, W.

SPIE - The International Society of Optical Engineering

Gao, D., Pogany, A., Stevenson, A.W., Gureyev, T.E., Wilkins, S.W.

SPIE - The International Society of Optical Engineering

A. Krol, H. Ye, R. Kincaid, J. Boone, M. Servol, J. Kieffer, Y. Nesterets, T. Gureyev, A. Stevenson, S. Wilkins, E. …

SPIE - The International Society of Optical Engineering

Y. Nesterets, T. Gureyev, A. Stevenson, A. Pogany, S. Wilkins

Society of Photo-optical Instrumentation Engineers

Johansson, G. A., Dynes, J. J., Hitchcock, A. P., Tyliszczak, T., Swerhone, G. D. W., Lawrence, J. R.

SPIE - The International Society of Optical Engineering

G. R. Myers, T. E. Gureyev, D. M. Paganin, K. K. W. Siu, S. C. Mayo

Society of Photo-optical Instrumentation Engineers

Momose, A., Yashiro, W., Moritake, M., Takeda, Y., Uesugi, K., Takeuchi, A., Suzuki, Y., Tanaka, M., Hattori, T.

SPIE - The International Society of Optical Engineering

S. Mayo, A. Stevenson, S. Wilkins, D.C. Gao, S. Mookhoek

Trans Tech Publications

Gureyev, T.E., Raven, C., Snigirev, A.A., Snigireva, I., Wilkins, S.W.

SPIE - The International Society of Optical Engineering

Jiang, M., Zhou, T., Cheng, J., Cong, W., Wang, G.

SPIE - The International Society of Optical Engineering

Rau, C., Crecea, V., Richter, C.-P., Peterson, K. M., Jemian, P. R., Neuhausler, U., Schneider, G., Yu, X., Braun, P. …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12