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Quantitative properties of complex porous materials calculated from x-ray μCT images (Invited Paper) [6318-38]

Author(s):
Sheppard, A. P.
Arns, C. H.
Sakellariou, A.
Senden, T. J.
Sok, R. M.
Averdunk, H.
Saadalfar, M.
Limaye, A.
Knackstedt, M. A. ( The Australian National Univ. (Australia) )
4 more
Publication title:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6318
Pub. Year:
2006
Page(from):
631811
Page(to):
631811
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
Language:
English
Call no.:
P63600/6318
Type:
Conference Proceedings

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