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Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV [6317-03]

Author(s):
Yin, -C. G. ( National Synchrotron Radiation Research Ctr. (Taiwan) and National Chiao Tung Univ. (Taiwan) )
Duewer, F.
Zeng, X.
Lyon, A.
Yun, W. ( Xradia Inc. (USA) )
Chen, -R. F. ( National Synchrotron Radiation Research Ctr. (Taiwan) and National Chiao Tung Univ. (Taiwan) )
Liang, S. K. ( National Synchrotron Radiation Research Ctr. (Taiwan) )
2 more
Publication title:
Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6317
Pub. Year:
2006
Page(from):
631703
Page(to):
631703
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463968 [0819463965]
Language:
English
Call no.:
P63600/6317
Type:
Conference Proceedings

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