Automatic inspection of small component on loaded PCB based on SVD and SVM [6315-30]

Automatic inspection of small component on loaded PCB based on SVD and SVM [6315-30]

Author(s):

Wang, Y. ( Dalian Univ. of Technology (China) and Public Security Marine Police Academy (China) )
Sun, Y.
Liu, M.
Lv, P.
Wu, T. ( Dalian Univ. of Technology (China) )

Publication title:

Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6315

Pub. Year:

2006

Page(from):

63150P

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463944 [0819463949]

Language:

English

Call no.:

P63600/6315

Type:

Conference Proceedings

Details

TDL ID:	ZA00016321
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications
Conf. info. (Number):	2006 : 9th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.15-2006.08.16

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