MIBS breadboard ready for testing [6296-52]

MIBS breadboard ready for testing [6296-52]

Author(s):

Publication title:

Earth Observing Systems XI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6296

Pub. Year:

2006

Page(from):

62961C

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463753 [0819463752]

Language:

English

Call no.:

P63600/6296

Type:

Conference Proceedings

Details

TDL ID:	ZA00016302
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Earth Observing Systems
Conf. info. (Number):	2006 : 11th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.14-2006.08.16

Similar Items:

1 Conference Proceedings MIBS Breadboard Ready for Testing J. A. P. Leijtens ESA Publications Division	7 Conference Proceedings IASI OGSE spot scan: design and realization of infrared test equipment for use in vacuum Kappelhof, J.P., Dekker, B., Spierdijk, H., Boslooper, E., Bokhove, H., Verhoeff, P. SPIE-The International Society for Optical Engineering
2 Conference Proceedings MIBS: past, present and future J. Leijtens, C. Hoegaerts, J. Barros, J. de Vries Society of Photo-optical Instrumentation Engineers	8 Conference Proceedings TNO TPD contributions to high-precision optical metrology: a Darwin metrology breadboard for ESA Verlaan, A. L., van den Dool, T. C., Braam, B. C., Calvel, B., Sesselman, R., Poschel, W., Dontsov, D., Cabeza Vega, I., … SPIE - The International Society of Optical Engineering
3 Conference Proceedings TNO AND THE ‘KEES’ OF THE INCREDIBLY SHRINKING SUNSENSOR J. Leijtens, K. de Boom ESA Publications Division	9 Conference Proceedings The ESA Science Programme - A View from the Netherlands Bleeker, J. ESA Publications Division
4 Conference Proceedings "Probavilistic Based Safety Factors in The Netherlands" Leijten M. J. Ad Kluwer Academic Publishers	10 Conference Proceedings Development of fiber optic sensors at TNO for explosion and shock wave measurements Prinse,W.C., Meer,B.J.van der, Scholtes,J.H.G., Cheng,L.K., Smorenburg,C., Bree,J.L.M.J.van, Bouma,R.H.B. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Optical instruments heading in a new direction [6296-45] Leijtens, J., Ubbels, W. J. SPIE - The International Society of Optical Engineering	11 Conference Proceedings Microsystem technology toughens up sun sensors for extreme environments (Invited Paper) [6308-13] Leijtens, J., de Boom, K. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Getting ELMER ready for science: laboratory tests [6269-21] Garcia-Vargas, M. L., Rodriguez-Espinosa, J. M., Martin-Fleitas, J. M., Kohley, R., Sanchez-Blanco, E., Hammersley, P. … SPIE - The International Society of Optical Engineering	12 Conference Proceedings Is lithography ready for 300 mm? Charles,A.B., Haris,C., Hornig,S.R., Ganz,D., Schedel,T., Hraschan,G., Kostler,W., Maltabes,J.G., Mautz,K.E., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12