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Fast surface profiling using monochromatic phase and fringe order in white-light interferometry [6292-57]

Author(s):
Publication title:
Interferometry XIII: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6292
Pub. Year:
2006
Page(from):
62921F
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463715 [081946371X]
Language:
English
Call no.:
P63600/6292
Type:
Conference Proceedings

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