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A curvature sensor using white-light scanning interferometry [6292-48]

Author(s):
Kim, B.
Kim, S.
Kwon, Y. ( Kyungnam Univ. (South Korea) )
Lee, Y.
Yang, H.
Rhee, H. ( Korea Research Institute of Standards and Science (South Korea) )
1 more
Publication title:
Interferometry XIII: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6292
Pub. Year:
2006
Page(from):
629219
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463715 [081946371X]
Language:
English
Call no.:
P63600/6292
Type:
Conference Proceedings

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