Effect of varied fringe width on measured profile in structured line projection method [6292-30]

Author(s):

• Song, G.
• Jia, M.
• Ning, Y.
• Zheng, J. ( GE Global Research (China) )
• Harding, K. ( GE Global Research (USA) )

Publication title:

Interferometry XIII: Techniques and Analysis

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6292

Pub. Year:

2006

Page(from):

62920T

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463715 [081946371X]

Language:

English

Call no.:

P63600/6292

Type:

Conference Proceedings