Effect of varied fringe width on measured profile in structured line projection method [6292-30]
- Author(s):
- Song, G.
- Jia, M.
- Ning, Y.
- Zheng, J. ( GE Global Research (China) )
- Harding, K. ( GE Global Research (USA) )
- Publication title:
- Interferometry XIII: Techniques and Analysis
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6292
- Pub. Year:
- 2006
- Page(from):
- 62920T
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463715 [081946371X]
- Language:
- English
- Call no.:
- P63600/6292
- Type:
- Conference Proceedings
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