Blank Cover Image

Near-field induced polarization imaging for optical data storage metrology [6282-13]

Author(s):
Publication title:
Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6282
Pub. date:
2006
Page(from):
62820D
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463579 [0819463574]
Language:
English
Call no.:
P63600/6282
Type:
Conference Proceedings

Similar Items:

Milster,T.D.

SPIE - The International Society for Optical Engineering

Hashimoto,N., Milster,T.D.

SPIE-The International Society for Optical Engineering

Chen, T., Milster, T. D., Yang, S.-H.

SPIE - The International Society of Optical Engineering

Hirota,K., Milster,T.D., Zhang,Y.

SPIE - The International Society for Optical Engineering

Park, -K. S., Milster, D. T., Zhang, Y.

SPIE - The International Society of Optical Engineering

Chen, T., Milster, T., Yang, S. H.

SPIE - The International Society of Optical Engineering

4 Conference Proceedings Design issues in optical data storage

T.D. Milster

Society of Photo-optical Instrumentation Engineers

Upton, R.S., Milster, T.D.

SPIE

Zhang, Y., Milster, T. D.

SPIE - The International Society of Optical Engineering

Milster,T.D., Upton,R.S., Luo,H.

SPIE-The International Society for Optical Engineering

6 Conference Proceedings Beam shaping for optical data storage

Walker,E.P., Milster,T.D.

SPIE-The International Society for Optical Engineering

Deng, X., Liu, X., Sciortino, Jr., P., Wang, J. J., Nikolov, A., Liu, F., Chen, L., Fiorillo, S., O’Brien, N.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12