Blank Cover Image

Low-noise low-power readout electronics circuit development in standard CMOS technology for 4 K applications [6275-43]

Author(s):
Publication title:
Millimeter and submillimeter detectors and instrumentation for astronomy III : 29-31 May, 2006, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6275
Pub. date:
2006
Page(from):
627516
Page(to):
627516
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463401 [081946340X]
Language:
English
Call no.:
P63600/6275
Type:
Conference Proceedings

Similar Items:

Merken, P., Creten, Y., Putzeys, J., Souverijns, T., Hoof, C. Van

SPIE - The International Society of Optical Engineering

Chang,S., Dai,C., Chiou,J., Chang,P.

SPIE-The International Society for Optical Engineering

A. Mercha, Y. Creten, J. Putzeys, P. Mercken, P. De Moor, C. Claeys, C. Van Hoof, E. Simoen, A. Mohammazadeh, R. Nickson

Electrochemical Society

8 Conference Proceedings Hybrid and CMOS-Based Infrared Detectors

Merken,P., Moor,P.De, John,J., Zimmermann,L., Gastal,M., Jain,S.C., Hoof,C.Van

SPIE - The International Society for Optical Engineering

D. S. Tezcan, J. Putzeys, K. De Munck, T. Souverijns, P. Merken

Society of Photo-optical Instrumentation Engineers

Racanelli, M, Huong, W M, Shin, H C, Foerstner, J, Pork, H, Ford, J, Wetteroth, T, Hong, S, Shin, H, Wilson, S R

Electrochemical Society

Charlier,O., Cronje,T., Hoof,C.A.Van

SPIE-The International Society for Optical Engineering

J. Lv, Y. Jiang, Y. Zhou, F. Luo

Society of Photo-optical Instrumentation Engineers

Simoen, Eddy, Mercha, Abdelkarim, Creten, Ybe, Merken, Patrick, Putzeys, Jan, De Moor, Piet, Claeys, Cor, Van Hoof, …

ESA Publication Division

Richter, H., Merken, P., Cneten, Y., Putzeys, J., Van Hoof, C.A., Katterloher, R.O., Rosenthal, D., Rumitz, M., …

SPIE-The International Society for Optical Engineering

Kraft,S., Merken,P., Creten,Y., Putzeys,J., Hoof,C.A.Van, Katterloher,R.O., Rosenthal,D., Rumitz,M., Grozinger,U., …

SPIE-The International Society for Optical Engineering

Tanaka,A., Chiba,K., Endoh,T., Okuyama,K., Kawahara,A., Iida,K., Tsukamoto,N.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12