Blank Cover Image

Material classification based on multiband polarimetric images fusion [6240-07]

Author(s):
Publication title:
Polarization: measurement, analysis, and remote sensing VII : 20-21 April 2006, Kissimmee, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6240
Pub. Year:
2006
Page(from):
624007
Page(to):
624007
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462961 [0819462969]
Language:
English
Call no.:
P63600/6240
Type:
Conference Proceedings

Similar Items:

Zhao, Y., Pan, Q., Zhang, H.

SPIE - The International Society of Optical Engineering

Yang, W., Zhao, D., Huang, Q., Ren, P., Feng, J., Zhang, X.

SPIE - The International Society of Optical Engineering

Zhao, Y., Pan, Q., Zhang, H.

SPIE - The International Society of Optical Engineering

H. Zhang, Z. Shan, C. Wang, J. Chen

ESA Communications

Zhao, Y., Pan, Q., Zhang, H.

SPIE - The International Society of Optical Engineering

Q. Guo, H. Hong, Y. Chen, Y. Zhang

Society of Photo-optical Instrumentation Engineers

Jones, G. D., Goldstein, H. D., Spaulding, C. J.

SPIE - The International Society of Optical Engineering

He L., Pan Q., Zhao Y., Di W.

SPIE - The International Society of Optical Engineering

Bai, J., Li, X., Hu, X., Zhang, X., Zhao, Y., Zhang, B., Tong, Q., Zheng, L.

SPIE-The International Society for Optical Engineering

H. Luo, L. Tong, X. Li, Y. Chen, X. Liu

Society of Photo-optical Instrumentation Engineers

Q. Pan, J. Wei, H. Cao, N. Li, H. Liu

SPIE - The International Society of Optical Engineering

Niu, L.H., Ni, G.Q., Liu, M.Q.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12