Blank Cover Image

Reliability, availability, and maintainability considerations for fiber optical sensor applications (Invited Paper) [6167-46]

Author(s):
  • Bronnirnonn. R ( Swiss Federal Labs. for Materials Testing and Research (Switzerland) )
  • Held M ( Swiss Federal Labs. forMaterials Testing and Research (Switzerland) )
  • Nellen P M ( Swiss Federal Labs. forMaterials Testing and Research (Switzerland) )
Publication title:
Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6167
Pub. Year:
2006
Page(from):
61671B
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462206 [0819462209]
Language:
English
Call no.:
P63600/6167
Type:
Conference Proceedings

Similar Items:

Nellen, P.M., Broennimann, R., Held, M., Sennhauser, U.

SPIE-The International Society for Optical Engineering

Bronnimann, R., Nellen, Ph. M., Anderegg, P., Sennhauser, U.

MRS - Materials Research Society

Held, M., Bronnimann, R., Nellen, M. P., Zhou, L.

SPIE - The International Society of Optical Engineering

Held, M., Broennimann, R., Nellen, P.M.

SPIE-The International Society for Optical Engineering

Nellen, P.M., Held, M.

SPIE-The International Society for Optical Engineering

Kiesel, S., Van Vickle, P., Peters, K., Hassan, T., Kowalsky, M.

SPIE - The International Society of Optical Engineering

Sennhauser,U.J., Bronnimann,R., Nellen,P.M.

SPIE-The International Society for Optical Engineering

Held, M.

SPIE-The International Society for Optical Engineering

Held, M., Nellen, P.M., Wosinska, L.

SPIE-The International Society for Optical Engineering

Bronnimann, Rolf, Nellen, Philipp M., Anderegg, Peter, Sennhauser, Urs

SPIE--International Society for Optical Engineering

Sennhauser,U.J., Bronnimann,R., Mauron,P., Nellen,P.M.

SPIE-The International Society for Optical Engineering

Nellen,Ph.M., Mauron,P., Frank,A., Pequignot,P., Bohnert,K.M., Brandle,H., Sennhauser,U.J.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12