
Double exposure technology using silicon containing materials [6153-57]
- Author(s):
Lee, S. ( Hynix Semiconductor Inc. (South Korea) ) Jung, J. ( Hynix Semiconductor Inc. (South Korea) ) Cho, S. ( Hynix Semiconductor Inc. (South Korea) ) Lim, C.-M. ( Hynix Semiconductor Inc. (South Korea) ) Bok, C. ( Hynix Semiconductor Inc. (South Korea) ) Kim, H. ( Hynix Semiconductor Inc. (South Korea) ) Moon, S. ( Hynix Semiconductor Inc. (South Korea) ) Kim, J. ( Hynix Semiconductor Inc. (South Korea) ) - Publication title:
- Advances in Resist Technology and Processing XXIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6153
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 61531K
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461964 [0819461962]
- Language:
- English
- Call no.:
- P63600/6153
- Type:
- Conference Proceedings
Similar Items:
1
![]() SPIE - The International Society of Optical Engineering |
7
![]() SPIE - The International Society of Optical Engineering |
2
![]() SPIE - The International Society of Optical Engineering |
8
![]() SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
![]() SPIE - The International Society of Optical Engineering |
4
![]() SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
![]() SPIE-The International Society for Optical Engineering |
11
![]() SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
12
![]() SPIE - The International Society of Optical Engineering |