Development of the automatic recipe generation system for CD-SEM using design data [6152-191]
- Author(s):
- Matsuoka, R. ( Hitachi High-Technologies Corp. (Japan) )
- Miyamoto, A. ( Hitachi Ltd. (Japan) )
- Nagatomo, W ( Hitachi Ltd. (Japan) )
- Morokuma, H. ( Hitachi High-Technologies Corp. (Japan) )
- Sutani, T ( Hitachi High-Technologies Corp. (Japan) )
- Publication title:
- Metrology, Inspection, and Process Control for Microlithography XX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6152
- Pub. Year:
- 2006
- Pt.:
- 2
- Page(from):
- 61524N
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461957 [0819461954]
- Language:
- English
- Call no.:
- P63600/6152
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Automated CD-SEM recipe creation: a new paradigm in CD-SEM utilization [6152-47]
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
New technique to reconstruct effective 3D profile from tilt images of CD-SEM
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Evaluation of OPC quality using automated edge placement error measurement with CD-SEM [6152-51]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
OPC model data collection for 45-nm technology node using automatic CD-SEM offline recipe creation
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
MPPC technique for gate etch process monitoring using CD-SEM images and its validity verification
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Automatic CD-SEM offline recipe creation for OPC qualification and process monitoring in a DRAM pilot-fab environment [6152-99]
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Accurate OPC model generation through use of a streamlined data flow incorporating automated test-structure layout and CD-SEM recipe generation [6156-65]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
New approach to the focus exposure matrix(FEM)sample measurement using CD-SEM
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |