Back end of line metrology control applications using scatterometry [6152-90]

Back end of line metrology control applications using scatterometry [6152-90]

Author(s):

Towidjaja, L. ( Accent Optical Technologies (USA) )
Raymond, C. ( Accent Optical Technologies (USA) )
Littau, M. ( Accent Optical Technologies (USA) )
Forman, D. ( Accent Optical Technologies (USA) )
Hummel, S. G. ( Accent Optical Technologies (USA) )

Publication title:

Metrology, Inspection, and Process Control for Microlithography XX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6152

Pub. Year:

2006

Pt.:

1

Page(from):

61521X

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461957 [0819461954]

Language:

English

Call no.:

P63600/6152

Type:

Conference Proceedings

Details

TDL ID:	ZA00016184
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Metrology, Inspection, and Process Control for Microlithography
Conf. info. (Number):	2006 : 20th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.02.20-2006.02.23

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