Advanced DFM applications using design-based metrology on CD SEM [6152-194]
- Author(s):
Lorusso, G. F. ( KLA-Tencor (USA) ) Capodieci, L. ( Advanced Micro Devices, Inc (USA) ) Stoler, D. ( KLA-Tencor (USA) ) Schulz, B. ( Advanced Mocro Devices, Inc. (USA) ) Roling, S. ( Advanced Mocro Devices, Inc. (USA) ) Schramm, J. ( Advanced Mocro Devices, Inc. (USA) ) Tabery, C. ( Advanced Mocro Devices, Inc. (USA) ) Shah, K. ( Advanced Mocro Devices, Inc. (USA) ) Singh, B. ( Advanced Mocro Devices, Inc. (USA) ) Abbott, G. ( KLA-Tencor (USA) ) Azordegan, A. ( KLA-Tencor (USA) ) Heinrichs, L. ( KLA-Tencor (USA) ) Kaliblotzky, Z. ( KLA-Tencor (USA) ) Castel, E. ( KLA-Tencor (USA) ) - Publication title:
- Metrology, Inspection, and Process Control for Microlithography XX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6152
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 61520B
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461957 [0819461954]
- Language:
- English
- Call no.:
- P63600/6152
- Type:
- Conference Proceedings
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